Figure 2.3: Schematic LEED pattern for Si{111}rt3xrt3-30-X. The empty circles are fractional-order beams. The beams labeled (a, b, c, d, e, and f) are (1/3 1/3, 2/3 2/3, 1/3 4/3, 4/3 1/3, 2/3 5/3, and 5/3 2/3) respectively. The ideal (solid) and superstructure (dashed) reciprocal-meshes are indicated.

Back to the List of Figures

Back to the experimental chapter

• Figure 2.1: Schematic LEED-AES retarding-field analyzer (RFA).
• Figure 2.2: Schematic LEED pattern for Si{111} 1x1.
• Figure 2.3: Schematic LEED pattern for Si{111}rt3*rt3-30-X.
• Figure 2.4: A LEED pattern of Si{111}7*7, at 100 eV.
• Figure 2.5: Schematic LEED Data Acquisition System.
• Figure 2.6: Reliability-factor (R_VHT, r_ZJ, and R_P) contour plots for the surface of TB{11-20}.
• Figure 2.7: Schematic AES Data Acquisition System.
• Figure 2.8: Typical Auger electron spectrum for Au deposited upon a Si{111} surface.
• Figure 2.9: Schematic LEED-AES Surface Analysis UHV System.